In addition to the profile of the cutting edge, the cutting edge angle and the position of the cutting edge in relation to the contact surface, the chip space topography must also be measured. With tolerances of approx. 5 µm to 20 µm, the requirements for measurement uncertainty are high to very high. This also applies to the measuring speed. A high point density is necessary for the measurement of the chip space topography.
-
Applications
- 3D free-form workpieces
- Extruded workpieces
- Moulds
- Semiconductor workpieces
- Lithographic structures
- Metal-plastic composite workpieces
- Prismatic workpieces
- Punched and bent parts
- Packaging
- Shaft-hub connections
- Shafts and axes
- Workpieces with micro-features
- Workpieces with optical functional surfaces
- Tools with geometrically determined cutting edges
- Tools with geometrically indeterminate cutting edges
- Gear wheels
- Cylindrical workpieces
- Industries
- Products
-
Service
- Programming services
- Measuring machine capability analysis, measurement process capability and traceability
- Measurement services with multi-sensor systems or computed tomography
- Repair
- Maintenance
- Calibration
- Installation, relocation and commissioning
- Retrofitting and updates
- Training courses
- Downloads
- About Werth
- Careers
- Foundation
- Publications
- Downloads